Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence
نویسندگان
چکیده
منابع مشابه
Convergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2018
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2018.03.013